Today, Wanji technology Xiaobian will introduce the characteristics of X-ray and the use of CCD detection of X-ray difficulties and characteristics, please see the details:

X-rays from 185nm to 0.01nm cannot travel through the air, so vacuum technology must be considered.

X-rays with keV or lower energy (XUV, VUV) cannot be detected by the front sensitive chip, so the back sensitive chip is needed. When the photon energy is higher than 10keV, the X-Ray photon is easy to penetrate the back sensitive CCD chip and cannot be detected, so the front sensitive depth depletion CCD chip is needed. For X-ray above 20keV, Only indirect detection method can be used, which increases the difficulty of image transmission and refrigeration.

Usually X-rays cannot be imitated by optical elements, so in the field of X-ray detection, resolution depends more on the size of the detected pixels than it does in the field of visible light, where resolution often depends on the number of pixels.

For direct detection, a single X-ray photon is sufficient to produce multiple photoelectrons, so sensitivity is usually judged by detection or absorption efficiency rather than quantum efficiency: for indirect detection, it is more complicated.

Also, because one photon can produce multiple photoelectrons, compared with visible CCD, X-ray CCD cameras are not very sensitive to readout noise and dark current. Of course, it is necessary to pay attention to readout noise when high frame rate is required.